Search For Equipment: Search All Categories Auctions Automatic Test Equipment Burn-In Systems Chemical Mechanical Polishing (CMP) Chemical Vapor Deposition (CVD) Clean Room Equipment Crystal Growing & Slicing Die Attachers Disk Manufacturing & Testing Dry Etching & Ashers Electronic Test Equipment Environmental Chambers Evaporators Facilities Equipment Flat Panel Display Furnaces Ion Implanters & Monitors Lab Equipment and Accessories Lithography & Photoresist Logistics and Transportation Marking Machines Misc. Molecular Beam Epitaxy Packaging PC Board Manufacturing & Test Probers Professional Services Rapid Thermal Processors Scribing / Dicing Spare Parts Sputtering Systems (PVD) Subsystems Wafer & Mask Scrubbers Wafer Grinding, Lapping & Polishing Wafer Handlers & Robotics Wafer Testing And Metrology Wet Processing Wire & Die Bonders X-Ray
Home Equipment For Sale Sell Your Equipment Equipment Wanted Help
You are not logged in.	[Login]  [Create New Account]
Site Activity (updated every 5 minutes) 18 people are currently browsing the site, 50 inquiries have been submitted to vendors so far today

198 items found for: Wafer Testing And Metrology Description Category Manufacturer Model Part Price ADE 9530 Ultra Gage 9530 Ultra Gage Thickness, Flatness (Global/Site) & Shape (Bow/Warp) Measurement System 4"" 5"" 6"" 8"" Wafer Testing And Metrology ADE 9530 Ultra Gage Inquire ADE 9500 Wafer Testing And Metrology ADE 9500 $85,000 ADE 9530-NT Ultra Gage Thickness, Flatness (Global/Site) & Shape (Bow/Warp) Measurement System 200mm Wafer Testing And Metrology ADE 9530-NT Inquire AMAT Compass Wafer Testing And Metrology AMAT Compass $350,000 AMAT SEM vision CX INSPECT SEM (W/F=200mm) Wafer Testing And Metrology AMAT SEM vision CX AMAT SEM vision CX INSPECT SEM (W/F=200mm) Wafer Testing And Metrology AMAT SEM vision CX AMAT SEM vision CX INSPECT SEM (W/F=200mm) Wafer Testing And Metrology AMAT SEM vision CX APPLIED MATERIALS DR SEMVision cX DR SEMVision G3 In Line Defect Review & Classification System 12"" Wafer Testing And Metrology APPLIED MATERIALS DR SEMVision cX Inquire APPLIED MATERIALS DR SEMVision cX DR SEMVision cX In Line Defect Review & Classification System 8"" Wafer Testing And Metrology APPLIED MATERIALS DR SEMVision cX Inquire Applied Materials DR SEMVision G3 G3 In-Line Defect Review & Classification System 300mm Wafer Testing And Metrology Applied Materials DR SEMVision G3 Inquire Applied Materials DR SEMVision cX In Line Defect Review & Classification System 200mm Wafer Testing And Metrology Applied Materials DR SEMVision cX Inquire BIO-RAD QS-2200 QS-2200 FTIR Measurement System 8"" Wafer Testing And Metrology BIO-RAD QS-2200 Inquire Bio-RAD Q5 Q5 wafer size Overlay Wafer Testing And Metrology Bio-RAD Q5 Inquire Bio-RAD Q7 Q7 wafer size Overlay Wafer Testing And Metrology Bio-RAD Q7 Inquire Bio-Rad QS-2200 FTIR Measurement System 200mm Wafer Testing And Metrology Bio-Rad QS-2200 Inquire ELECTROGLAS EG 2001 2010 The 2000 series wafer probers are controlled and operated through the use of two consoles (the operator’s console and the monitor console), simple push-button controls on each indexer (cassette handling platform), and basic camera illumination controls on the front of the power module. The unique ELECTROGLAS solid-state high-speed X-Y Positioning System permits simplified wafer loading and unloading outside the probe ring area with high-speed travel to and from the load position. Wafer Testing And Metrology ELECTROGLAS EG 2001 2010 Inquire ELECTROGLAS EG 1034 (peterchen@allwin21.com)----The ELECTROGLAS Model 1034X Automatic Wafer Probe is a precision instrument for testing and classifying semiconductor devices in wafer form. The Model I034X is a self-nontained system comprising two modules, a probe module and a power module. Both modules are designed for compact bench-top mounting; however, an interconnecting cable permits remote mounting of the power module when desired. Wafer Testing And Metrology ELECTROGLAS EG 1034 Inquire HITACHI S-8840 S-8840 8"" wafer size CD-sem Wafer Testing And Metrology HITACHI S-8840 Inquire HITACHI S-6000 S-6000 6"" wafer size CD-sem Wafer Testing And Metrology HITACHI S-6000 Inquire HITACHI S-6000 S-6000 6"" wafer size CD-sem Wafer Testing And Metrology HITACHI S-6000 Inquire HITACHI S-6000 S-6000 6"" wafer size CD-sem Wafer Testing And Metrology HITACHI S-6000 Inquire HITACHI S-6180 S-6180 6"" wafer size CD-sem Wafer Testing And Metrology HITACHI S-6180 Inquire HITACHI S-6280 S-6280 6"" wafer size CD-sem Wafer Testing And Metrology HITACHI S-6280 Inquire HITACHI S-6280 S-6280 6"" wafer size CD-sem Wafer Testing And Metrology HITACHI S-6280 Inquire HITACHI S-7280H S-7280H 6"" wafer size CD-sem Wafer Testing And Metrology HITACHI S-7280H Inquire Page 1 of 8 Previous 1 | 2 | 3 | 4 | 5 Next Go To Page: Copyright 2008 wSemi.com - All Rights Reserved.